44th IFIP WG 10.4 Meeting
Monterey, CA, USA -- June 25-29, 2003

Workshop on "Measuring Assurance in Cyberspace"

Coordinators:
  Jaynarayan H. Lala, DARPA, Arlington, VA, USA
  William H. Sanders, University of Illinois at Urbana-Champaign, USA

Overview

Introduction  to the Workshop
Session 1.1  Setting the Stage: Understanding Attacker Behavior and Current Practice
Session 1.2  Model-Based Quantification 
Session 1.3  Measurement-Based Quantification and Total Information Assurance Case
Session 1.4  Synthesis and Concluding Remarks


Workshop on "Hardware Design and Dependability"

Coordinators:
  Jacob A. Abraham, University of Texas at Austin, USA
  Neeraj Suri, Darmstadt University of Technology, Germany

Overview

Session 2.1  Challenges for Hardware Design and Evolving Fault Models
Session 2.2  Impact of COTS Technology
Session 2.3  Architectural Techniques
Session 2.4  Panel: Challenges, Opinions, Perspectives and Proposals


Workshop 1 -- Measuring Assurance in Cyberspace -- Thursday, June 26

Introduction

Jay Lala and Bill Sanders
Overview of Workshop Goals

Session 1.1  --   Setting the Stage: Understanding Attacker Behavior and Current Practice
Moderator: David Powell, LAAS-CNRS, Toulouse, France

Dennis Hollingworth, NAI Labs, Los Angeles, CA, USA
Towards Threat, Attack, and Vulnerability Taxonomies

Roy Maxion, Carnegie-Mellon University, Pittsburgh, PA, USAA
Defense-Centric Taxonomy

George W. Dinolt, US Naval Postgraduate School, Monterey, CA, USA
Use of Formal Methods in Assessment of Information Assurance Properties

Bradley Wood, BBN Technologies, Columbia, MD, USA
Using Red Teams to Evaluate Adversary Impact on Survivable Systems

Session 1.2  --  Model-Based Quantification
Moderator: John F. Meyer, University of Michigan, Ann Arbor, USA

Bev Littlewood, City University, London, UK
Can Diversity Modeling Help Security Studies

Bill Sanders
Probabilistic Quantification of Survivability Properties

Session 1.3  --  Measurement-Based Quantification & Total Information Assurance Case
Moderator: Paulo Veríssimo, University of Lisbon, Portugal

Victoria Stavridou, SRI International, Menlo Park, CA,USA
Global Measures of Information Assurance

Ravishankar K. Iyer, University of Illinois at Urbana-Champaign, USA
Analyzing Data on Security Vulnerabilities

Crispin Cowan, Immunix Corp, Portland, OR, USA
Relative Vulnerability Methodology

Yves Deswarte, LAAS-CNRS, Toulouse, France
Towards Quantitative Evaluation of Security

Session 1.4  --  Synthesis and Concluding Remarks
Moderators: Jay Lala and Bill Sanders

David Powell
Summary of Session 1.1

John Meyer
Summary of Session 1.2

Paulo Veríssimo
Summary of Session 1.3


First Day of Workshop 2  -- Hardware Design and Dependability --  Saturday, June 28
 

Session 2.1  --  Challenges for Hardware Design and Evolving Fault Models
Moderator: W. Kent Fuchs, Cornell University, Ithaca, NY, USA

Makoto Takamiya, NEC Corporation, Kanagawa, Japan
Challenges to Dependable VLSIs

Raphael Some, NASA Jet Propulsion Laboratory, Pasadena, CA, USA
Radiation Models and Hardware Design

Session 2.2  --  Impact of COTS Technology
Moderator: David R. Rennels, University of California at Los Angeles, USA

Philip Shirvani, Stanford University, CA, USA
COTS Technology & Issues -- Space Environments

Hermann Kopetz, Vienna University of Technology, Austria
COTS Technology & Issues --Automotive Environments

Session 2.3  --  Architectural Techniques
Moderator: Jean Arlat , LAAS-CNRS, Toulouse, France

Shubhendu S. Mukherjee, Intel Corporation, Shrewsbury, MA, USA
An Architectural Perspective on Soft Error Upsets from Radiation

Second Day of Workshop 2  -- Hardware Design and Dependability --  Sunday,  June 29 (morning)

Session 2.4  --  Panel: Challenges, Opinions, Perspectives and Proposals
Moderator: Neeraj Suri

Algirdas Avizienis, Vytautus Magnus University, Kaunas, Lithuania
Challenges, Opinions and Perspectives

T. Basil Smith, IBM TJ Watson Research Center, Hawthorne, NY, USA
Technology and Business Driven Challenges

Zbigniew Kalbarczyck, University of Illinois at Urbana-Champaign, USA
Tiered Error Detection and Recovery

Ying C. Yeh, Boeing Company, Seattle, WA, USA
Challenges of Electronics Hardware Technology for High Integrity Aerospace Applications

Hermann Kopetz, Vienna University of Technology, Austria
Challenges and Proposal