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4th Workshop on Dependable and Secure Nanocomputing

In conjunction with the 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks


The Final Program with links to presentations is available — See below

<.txt>  Call for Contributions  <.pdf> 
When: Monday June 28, 2010 
Where: Chicago, IL, USA

Motivation and Objectives

Nanocomputing technologies hold the promise of higher performance, lower power consumption as well as increased functionality. However, the dependability of these unprecedentedly small devices remains uncertain. The main sources of concern are:

  • Nanometer devices are expected to be highly sensitive to process variations. The guard-bands used today for avoiding the impact of such variations will not represent a feasible solution in the future. As a consequence timing errors may occur more frequently.
  • New failure modes, specific to new materials, are expected to raise serious challenges to the design and test engineers.
  • Environment induced errors, like single event upsets (SEU), are likely to occur more frequently than in the case of conventional semiconductor devices
  • New hardware redundancy techniques are needed to enable development of highly energy efficient systems.
  • The increased complexity of the systems based on nanotechnology will require improved computer aided design (CAD) tools, as well as better validation techniques.
  • Security of nanocomputing systems may be threatened by malicious attacks targeting new vulnerable areas in the hardware.

Hardware implemented fault tolerance features are becoming employed widely for dealing with these dependability issues. The use of error correcting codes, as well as space and time redundancy, is expected to significantly increase. Providing high dependability to the end users also requires improved error reporting, recovery, and system manageability. As a consequence the role of software solutions will increase. Software will also play the leading role in the improvement of design and validation tools. Furthermore, improved parallel processing programming paradigms are needed due to the advent of multicore processors. We believe DSN is the appropriate venue for discussing these challenges and potential solutions.

Scope and Topics

For this year's edition, we would like to focus the Workshop on Architecting, Designing, Manufacturing, and Assessing Dependable Nanocomputing Systems, with a special attention being paid to the following topical areas:

  • Nanocomputing architectures for high dependability
  • Design and validation techniques for coping with increased complexity
  • Manufacturing nanodevices
  • Failure mode analysis and testing issues specific to nanoscale computers

Contributions related to these main topics will allow the Workshop to continue the debate on the issues posed by nanocomputing, as well as the best solutions for providing highly dependable systems and networks to the end users. In addition to the diverse set of problems addressed in the previous editions, including issues related to process variations, aging, particle radiation and security vulnerabilities, this year we would like to encourage contributions on new CAD tools and validation techniques, and the mitigation of impairments related to power dissipation and reduced energy consumption.

Participation, Submission and Selection Process

The Workshop is open to all researchers, system developers and users who are involved with or have an interest in dependability and security of hardware technologies. Both invited and submitted contributions will be included in the Workshop program. We are interested in contributions from both industry and academia on all topics related to dependable and secure nanocomputing. Potential topics of interest include, but are not limited to: failure modes and risk assessment, yield and mitigation techniques in nanoscale technologies, on-line adaptive and reconfigurable nanoarchitectures, design techniques for developing resilient nanosystems, fault-tolerant architectures specific to nanoscale circuits, scalable verification and testing methodologies, network on chip and communication protocols, etc.

All prospective contributors should submit an extended abstract, work-in-progress report or position paper. Submissions must be original work with no substantial overlap with previously published papers or simultaneous submissions to a journal or conference with proceedings. The submissions should conform to the proceedings publication format (IEEE Conference style) and should not exceed six pages (including all text, references, appendices, and figures). They should explain the contribution to the field and the novelty of the work, making clear the current status of the work. Each submission should start with a title, a short abstract, and names and contact information of the authors. Submissions will be fully refereed by three PC members. Authors of accepted papers must guarantee that their paper will be presented at the Workshop. Accepted papers will be published in a supplement volume of the DSN 2010 proceedings. Outstanding contributions will be offered the opportunity of submitting extended versions to appear into an edited book.

Submissions must be made electronically (in PDF format), preferably via the Submission and Evaluation link (see above). The organizers can be reached by e-mail at: dsn2010-nanocomputing[at]laas.fr.

Important Dates

Submission deadline: March 15, 2010
Author notification: April 19, 2010
Camera ready copy : May 3, 2010

Workshop Organizers

  • Jean Arlat, LAAS-CNRS, Toulouse, France — Email: jean.arlat[at]laas.fr
  • Cristian Constantinescu, AMD, Fort Collins, CO, USA — Email: cristian.constantinescu[at]amd.com
  • Ravishankar K. Iyer, UIUC, Urbana-Champaign, USA  — Email: rkiyer[at]uiuc.edu
  • Johan Karlsson, Chalmers University of Technology, Göteborg, Sweden — Email: johan[at]chalmers.se
  • Michael Nicolaïdis, TIMA, Grenoble, France — Email: michael.nicolaidis[at]imag.fr

Program Committee

  • Davide Appello, STMicroelectronics, Agrate Brianza, Italy
  • Vikas Chandra, ARM R&D, San Jose, CA, USA
  • Abhijit Chatterjee, GeorgiaTech, Atlanta, USA
  • Yves Crouzet, LAAS-CNRS, Toulouse, France
  • Babak Falsafi, EPFL, Lausanne, Switzerland
  • Eishi Ibe, Hitachi Ltd, Yokohama, Japan
  • Régis Leveugle, TIMA, Grenoble, France
  • Cecilia Metra, University of Bologna, Italy
  • Helia Naeimi, Intel Corporation, Santa Clara, CA, USA


  • Takashi Nanya, Canon Inc., Tokyo, Japan
  • Jean-Jacques Quisquater, UCL, Louvain, Belgium
  • Juan Carlos Ruiz García, Univ. Politécnica de Valencia, Spain
  • Andreas Steininger, Vienna University of Technology, Austria
  • Arnaud Virazel, LIRMM, Montpellier, France
  • Seongmoon Wang, NEC Laboratories America, Princeton, NJ, USA
  • Alan Wood, Sun Microsystems, Santa Clara, CA, USA
  • Hans-Joaquim Wunderlich, University of Stuttgart, Germany
  • Tomohiro Yoneda, National Institute of Informatics, Tokyo, Japan

Further Information

For more information about DSN-2010 and the venue, please visit the conference web site at: http://www.dsn.org.
For workshop information, please send an email to the workshop organizers at: dsn2010-nanocomputing[at]laas.fr.
Information about the previous editions of the Workshop are available at: http://www.laas.fr/WDSN07, http://www.laas.fr/WDSN08 and http://www.laas.fr/WDSN09

Last Update: 2010-09-18 21:31