======================================================================== Please post and disseminate. Thanks! Our apologies for any replication of this announcement ======================================================================== ======================================================================== THIRD WORKSHOP ON DEPENDABLE AND SECURE NANOCOMPUTING CALL FOR CONTRIBUTIONS ---------------------- Monday June 29, 2009 Estoril, Lisbon, Portugal ------------------------------------------------------------------------ In conjunction with the 39th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (www.dsn.org) Also linked to the 15th IEEE Int. On-Line Testing Symp. (IOLTS) to be held in Lisbon area on June 24-27, 2009 (www-tima.imag.fr/conferences/iolts/iolts09) >>> New submission deadline <<< ------------------------------------------------------------------------ IMPORTANT DATES --------------- - Submission deadline: March 23, 2009 - Author notification: April 20, 2009 - Camera ready copy : May 11, 2009 ======================================================================== MOTIVATION AND THEME -------------------- Unprecedented levels of information processing, novel architectural solutions and a new realm of applications promise to be reached thanks to the advances in semiconductor technologies for integrating extremely large numbers of transistors or processing elements into a chip. Towards this ends, two main tracks are being considered: 1. Top-down "More Moore": this track is pushing further the long standing Moore's Law-based trend in chip development that aims at reducing the dimensions of silicon microelectronics and is progressively reaching nanometric scale elementary devices. 2. Bottom-up "Beyond Moore": this track features atomic assemblies of nanoscale technologies; these include nanowires, carbon nanotubes or organic molecules, etc., and extend also to quantum computing, optical computing and micro/nanofluidics. Due to the differences in relative advances and current industrial concerns attached to each track, this third edition of the Workshop will mphasize the top-down track for which it is widely recognized that such an evolution raises serious challenges both from the Dependability and Security viewpoints. Nevertheless, considerations attached to the emerging nanoscale technologies are also part of the scope of the Workshop. Indeed, such technologies are intrinsically exposed to a significant rate of residual defects and fault occurrence and - to some extent - reminds the early days of digital computers and relate to the seminal work then developed to improve their reliability. The long standing Moore's Law-based trend in IC development is aiming at nanometric scale elementary devices. Such technologies are already impaired by significant variations affecting process parameters and thus become a nightmare to reliability engineers for reaching an acceptable manufacturing yield at viable cost. The dramatic reduction of digital devices is accompanied by a decrease in power supply and threshold levels which in turn results in lower noise immunity and greater exposure to particles. Moreover, additional instabilities may affect circuit parameters in operation, e.g., in CMOS devices negative bias temperature instability (NBTI) has a strong impact on threshold voltage over time. Examples of vulnerabilities and malicious threats related to hardware chips are information leakages attached to side channels attacks or differential fault analysis based on applying environmental disturbances or even fault injection. Device downsizing and increased chip complexity are commonly understood as positive factors in reducing hardware vulnerabilities with respect to security issues (especially for what concerns cryptochips or IC intellectual property). Nevertheless, one should not neglect the related problems attached to the observability and controllability facilities provided by scan-based testing devices incorporated into the chips. SCOPE AND OBJECTIVES -------------------- The Workshop is aimed at characterizing these impairments and threats as well as distinguishing the design approaches and operation control paradigms that have to be enforced and/or favored in order to keep achieving dependable and secure computing. Three main goals are identified for the Workshop: * Review the state-of-knowledge concerning the threats at stake in nanocomputing technologies: manufacturing defects, accidental operational faults, malicious attacks. * Report on existing solutions and propose new solutions attached to various design options for mitigating faults and implementing secure and resilient computing devices and systems. * Forecast the risks associated to emerging technologies and foster new trends for cooperative work, possibly combining various alternatives to help increase the pace of advances and solutions. PARTICIPATION, SUBMISSION AND SELECTION PROCESS ----------------------------------------------- The Workshop is open to all researchers, system developers and users who are involved with or have an interest in dependability and security of hardware technologies. We are interested in submissions from both industry and academia on all topics related to dependable and secure nanocomputing. Potential topics of interest include, but are not limited to: failure modes and risk assessment, yield and mitigation techniques in nanoscale technologies, on-line adaptive and reconfigurable nanoarchitectures, design techniques for developing resilient nanosystems, fault-tolerant architectures specific to nanoscale circuits, scalable verification and testing methodologies, network on chip and communication protocols, etc. All prospective contributors should submit an extended abstract, work-in-progress report or position paper. Submissions must be original work with no substantial overlap with previously published papers or simultaneous submissions to a journal or conference with proceedings. The submissions should conform to the proceedings publication format (IEEE Conference style) and should not exceed six pages (including all text, references, appendices, and figures). They should explain the contribution to the field and the novelty of the work, making clear the current status of the work. Each submission should start with a title, a short abstract, and names and contact information of the authors. Submissions must be made electronically (in PDF format), preferably via the Workshop Webpage (www.laas.fr/WDSN09). Submissions will be fully refereed by three PC members. Authors of accepted papers must guarantee that their paper will be presented at the Workshop. Accepted papers will be published in a supplement volume of the DSN 2009 proceedings. ABOUT DSN and IOLTS ------------------- In 2009, IOLTS and DSN will be held back to back in geographically close sites in Lisbon area (IOLTS finishing two days before WDSN09). IOLTS and WDSN cover technically close, though complementary, domains. This provides a unique opportunity to interested participants attending both events to benefit from a comprehensive coverage of topics related to dependable and secure computing and critical applications, spanning technology level, gate-level and RTL level issues, analysis and assessment techniques as well as architectures encompassing also software and system levels. www.dsn.org www-tima.imag.fr/conferences/iolts/iolts09 WORKSHOP ORGANIZERS ------------------- * Jean Arlat, LAAS-CNRS, Toulouse, France * Cristian Constantinescu, AMD, Fort Collins, CO, USA * Ravishankar K. Iyer, UIUC, Urbana-Champaign, USA * Johan Karlsson, Chalmers Univ. of Technology, Gšteborg, Sweden * Michael Nicola•dis, TIMA, Grenoble, France The Workshop organizers can be reached by e-mail at: dsn2009-nanocomputing[at]laas.fr. PROGRAM COMMITTEE ----------------- * Jacob A. Abraham, University of Texas, Austin, USA * Lorena Anghel, TIMA, Grenoble, France * Davide Appello, STMicroelectronics, Agrate Brianza, Italy * Vikas Chandra, ARM R&D, San Jose, CA, USA * Yves Crouzet, LAAS-CNRS, Toulouse, France * Giorgio Di Natale, LIRMM, Montpellier, France * Babak Falsafi, EPFL, Lausanne, Switzerland * Richard E. Harper, IBM Research, Yorktown Heights, NY, USA * Shubhendu S. Mukherjee, Intel, Hudson, MA, USA * Takashi Nanya, University of Tokyo, Japan * Jean-Jacques Quisquater, UCL, Louvain, Belgium * Juan Carlos Ruiz Garc’a, Univ. PolitŽcnica de Valencia, Spain * Allan Silburt, Cisco Systems, Ottawa, ON, Canada * Arun Somani, Iowa State University, Ames, USA * Janusz Sosnowski, Warsaw University of Technology, Poland * Andreas Steininger, Vienna University of Technology, Austria * Alan Wood, Sun Microsystems, Santa Clara, CA, USA * Yervant Zorian, Virage Logic, Fremont, CA, USA FURTHER INFORMATION ------------------- For more information about DSN-2009 and the venue, please see the conference Web site at: http://www.dsn.org. For up-to-date information about the Workshop, please visit the Workshop Web site at: www.laas.fr/WDSN09 or contact the organizers by e-mail at: dsn2009-nanocomputing[at]laas.fr. Information about the previous editions of the Workshop can be obtained from: http://www.laas.fr/WDSN07 and http://www.laas.fr/WDSN08. IMPORTANT DATES --------------- New Submission deadline: March 23, 2009 Author notification: April 20, 2009 Camera ready copy : May 11, 2009 ========================================================================